{"title":"一个200兆赫CMOS锁相环与双相位检测器","authors":"K. M. Ware, H. Lee, C. Sodini","doi":"10.1109/ISSCC.1989.48255","DOIUrl":null,"url":null,"abstract":"The authors describe a 200-MHz PLL (phase-locked loop) in a 2- mu m CMOS technology employing an untrimmed current-controlled ring oscillator (CCO). Two phase detectors are included: a phase-frequency detector (PFD) for fast acquisition during data preamble (100% pulse density), and a mixer phase detector to lock on actual data (in the presence of missing pulses). Simulation results and experimental data using an external current source suggest that using the bandgap reference, the CCO supply sensitivity will be 4%/V and the CCO temperature coefficient will be about 500 p.p.m./ degrees C. Internal input and output waveforms in lock were measured from buffered test pads with a low-capacitance wideband buffered probe.<<ETX>>","PeriodicalId":385838,"journal":{"name":"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"66","resultStr":"{\"title\":\"A 200 MHz CMOS phase-locked loop with dual phase detectors\",\"authors\":\"K. M. Ware, H. Lee, C. Sodini\",\"doi\":\"10.1109/ISSCC.1989.48255\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors describe a 200-MHz PLL (phase-locked loop) in a 2- mu m CMOS technology employing an untrimmed current-controlled ring oscillator (CCO). Two phase detectors are included: a phase-frequency detector (PFD) for fast acquisition during data preamble (100% pulse density), and a mixer phase detector to lock on actual data (in the presence of missing pulses). Simulation results and experimental data using an external current source suggest that using the bandgap reference, the CCO supply sensitivity will be 4%/V and the CCO temperature coefficient will be about 500 p.p.m./ degrees C. Internal input and output waveforms in lock were measured from buffered test pads with a low-capacitance wideband buffered probe.<<ETX>>\",\"PeriodicalId\":385838,\"journal\":{\"name\":\"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"66\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1989.48255\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1989.48255","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 66
摘要
作者描述了一个200 mhz锁相环(锁相环)在一个2 μ m CMOS技术,采用无修整电流控制环振荡器(CCO)。包括两个相位检测器:一个相位频率检测器(PFD)用于数据前置(100%脉冲密度)期间的快速采集,一个混频器相位检测器用于锁定实际数据(在缺少脉冲的情况下)。采用外部电流源的仿真结果和实验数据表明,使用带隙基准,CCO电源灵敏度为4%/V, CCO温度系数约为500 p.p.m./度。锁相内部输入输出波形在缓冲测试垫上用低电容宽带缓冲探头测量。
A 200 MHz CMOS phase-locked loop with dual phase detectors
The authors describe a 200-MHz PLL (phase-locked loop) in a 2- mu m CMOS technology employing an untrimmed current-controlled ring oscillator (CCO). Two phase detectors are included: a phase-frequency detector (PFD) for fast acquisition during data preamble (100% pulse density), and a mixer phase detector to lock on actual data (in the presence of missing pulses). Simulation results and experimental data using an external current source suggest that using the bandgap reference, the CCO supply sensitivity will be 4%/V and the CCO temperature coefficient will be about 500 p.p.m./ degrees C. Internal input and output waveforms in lock were measured from buffered test pads with a low-capacitance wideband buffered probe.<>