提高分布式信息测量系统中测控模块的数据可靠性

2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO) Pub Date : 2017-04-01 DOI:10.1109/ELNANO.2017.7939806

R. Kochan, A. Sachenko, V. Kochan, M. Yanovsky, Orest Kochan, V. Kharchenko

{"title":"提高分布式信息测量系统中测控模块的数据可靠性","authors":"R. Kochan, A. Sachenko, V. Kochan, M. Yanovsky, Orest Kochan, V. Kharchenko","doi":"10.1109/ELNANO.2017.7939806","DOIUrl":null,"url":null,"abstract":"A method of improving the reliability of sensory data coming from measurement and control modules of distributed information-measuring systems and control actions formed by those modules is described. The proposed technical solutions by correcting additive, multiplicative and nonlinear error components of analog-to-digital converters provide the high reliability, survivability and. The preliminary reliability assessment of the proposed module is carried-out, and it confirmed the redundancy mechanisms need to be applied on the individual microcontroller, the sensor and the individual execution unit.","PeriodicalId":333746,"journal":{"name":"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)","volume":"301 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Improving the data reliability of measurement and control modules for distributed information-measuring systems\",\"authors\":\"R. Kochan, A. Sachenko, V. Kochan, M. Yanovsky, Orest Kochan, V. Kharchenko\",\"doi\":\"10.1109/ELNANO.2017.7939806\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of improving the reliability of sensory data coming from measurement and control modules of distributed information-measuring systems and control actions formed by those modules is described. The proposed technical solutions by correcting additive, multiplicative and nonlinear error components of analog-to-digital converters provide the high reliability, survivability and. The preliminary reliability assessment of the proposed module is carried-out, and it confirmed the redundancy mechanisms need to be applied on the individual microcontroller, the sensor and the individual execution unit.\",\"PeriodicalId\":333746,\"journal\":{\"name\":\"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)\",\"volume\":\"301 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELNANO.2017.7939806\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELNANO.2017.7939806","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

的方法改善感官数据来自测量和控制的可靠性分布式information-measuring系统的模块和控制行动由这些模块。通过对模数转换器的加性、乘性和非线性误差分量进行校正，提供了高可靠性、高生存性和高可靠性的技术解决方案。初步提出了模块的可靠性评估也是,它证实了冗余机制需要应用于单个单片机,传感器和个人执行单元。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Improving the data reliability of measurement and control modules for distributed information-measuring systems

A method of improving the reliability of sensory data coming from measurement and control modules of distributed information-measuring systems and control actions formed by those modules is described. The proposed technical solutions by correcting additive, multiplicative and nonlinear error components of analog-to-digital converters provide the high reliability, survivability and. The preliminary reliability assessment of the proposed module is carried-out, and it confirmed the redundancy mechanisms need to be applied on the individual microcontroller, the sensor and the individual execution unit.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)

自引率

0.00%

发文量