T. Kuroda, T. Kuriyama, Y. Matsuda, T. Kozono, S. Matsumoto, Y. Hiroshima, K. Horii
{"title":"一种抑制涂片的CCD成像仪","authors":"T. Kuroda, T. Kuriyama, Y. Matsuda, T. Kozono, S. Matsumoto, Y. Hiroshima, K. Horii","doi":"10.1109/ISSCC.1986.1157017","DOIUrl":null,"url":null,"abstract":"This report will describe a 502×600 element interline-transfer CCD imager which realizes a 100-fold reduction in smear level, through the use of a flared photodiode structure.","PeriodicalId":440688,"journal":{"name":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"A smear-suppressing CCD imager\",\"authors\":\"T. Kuroda, T. Kuriyama, Y. Matsuda, T. Kozono, S. Matsumoto, Y. Hiroshima, K. Horii\",\"doi\":\"10.1109/ISSCC.1986.1157017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This report will describe a 502×600 element interline-transfer CCD imager which realizes a 100-fold reduction in smear level, through the use of a flared photodiode structure.\",\"PeriodicalId\":440688,\"journal\":{\"name\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1986.1157017\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1986.1157017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This report will describe a 502×600 element interline-transfer CCD imager which realizes a 100-fold reduction in smear level, through the use of a flared photodiode structure.
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