电缆绝缘缺陷处应力增强的建模

T. Person, K. Yang, J. Jiang
{"title":"电缆绝缘缺陷处应力增强的建模","authors":"T. Person, K. Yang, J. Jiang","doi":"10.1109/ELINSL.2006.1665367","DOIUrl":null,"url":null,"abstract":"AC breakdowns are commonly used as a performance indicator for power cables, and yet the data generated can be misinterpreted if the test section of cable is found to have a manufacturing defect. As an example, in a recent publication, dielectric a breakdown value on a 17-year field aged cable was treated as a \"suspension\" by the authors after the discovery of a conductor shield skip at the failure location; and yet, others have taken the same data set and have analyzed the uncensored data as indicative of the material performance. In an effort to resolve the differences, the same data set is considered here, with an assumption that degree of aging is not significantly impacted by any enhancement of field-aging stresses. Statistical analysis is performed to determine if the questionable breakdown value can be considered an outlier. A 2-dimensional finite element analysis based upon the shape of the defect enables an estimate of the local stress enhancement factor, and a \"corrected\" breakdown value is calculated. The original authors conservative treatment of the questionable breakdown value as a \"suspension\" is supported by analysis with inclusion of a stress-corrected breakdown value, and the two approaches yield similar failure distributions. Use of the uncorrected value in discussions related to failure probabilities on the low-stress side of the distribution is shown to substantially underestimate failure stresses","PeriodicalId":427638,"journal":{"name":"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling of stress-enhancement at defects inside cable insulation\",\"authors\":\"T. Person, K. Yang, J. Jiang\",\"doi\":\"10.1109/ELINSL.2006.1665367\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"AC breakdowns are commonly used as a performance indicator for power cables, and yet the data generated can be misinterpreted if the test section of cable is found to have a manufacturing defect. As an example, in a recent publication, dielectric a breakdown value on a 17-year field aged cable was treated as a \\\"suspension\\\" by the authors after the discovery of a conductor shield skip at the failure location; and yet, others have taken the same data set and have analyzed the uncensored data as indicative of the material performance. In an effort to resolve the differences, the same data set is considered here, with an assumption that degree of aging is not significantly impacted by any enhancement of field-aging stresses. Statistical analysis is performed to determine if the questionable breakdown value can be considered an outlier. A 2-dimensional finite element analysis based upon the shape of the defect enables an estimate of the local stress enhancement factor, and a \\\"corrected\\\" breakdown value is calculated. The original authors conservative treatment of the questionable breakdown value as a \\\"suspension\\\" is supported by analysis with inclusion of a stress-corrected breakdown value, and the two approaches yield similar failure distributions. Use of the uncorrected value in discussions related to failure probabilities on the low-stress side of the distribution is shown to substantially underestimate failure stresses\",\"PeriodicalId\":427638,\"journal\":{\"name\":\"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELINSL.2006.1665367\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELINSL.2006.1665367","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

交流故障通常被用作电力电缆的性能指标,然而,如果发现电缆的测试部分存在制造缺陷,则产生的数据可能会被误解。例如,在最近的一篇文章中,在发现故障位置的导体屏蔽跳变后,作者将17年现场老化电缆的介电击穿值视为“暂停”;然而,其他人采用相同的数据集,并分析了未经审查的数据,作为材料性能的指示。为了解决这些差异,这里考虑了相同的数据集,并假设老化程度不受任何场老化应力增强的显著影响。进行统计分析以确定是否可以将可疑的击穿值视为异常值。基于缺陷形状的二维有限元分析可以估计局部应力增强因子,并计算“修正”击穿值。原作者将可疑的击穿值作为“悬浮液”的保守处理得到了包含应力校正击穿值的分析的支持,两种方法产生相似的破坏分布。在与分布的低应力侧的失效概率有关的讨论中使用未校正的值显示大大低估了失效应力
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling of stress-enhancement at defects inside cable insulation
AC breakdowns are commonly used as a performance indicator for power cables, and yet the data generated can be misinterpreted if the test section of cable is found to have a manufacturing defect. As an example, in a recent publication, dielectric a breakdown value on a 17-year field aged cable was treated as a "suspension" by the authors after the discovery of a conductor shield skip at the failure location; and yet, others have taken the same data set and have analyzed the uncensored data as indicative of the material performance. In an effort to resolve the differences, the same data set is considered here, with an assumption that degree of aging is not significantly impacted by any enhancement of field-aging stresses. Statistical analysis is performed to determine if the questionable breakdown value can be considered an outlier. A 2-dimensional finite element analysis based upon the shape of the defect enables an estimate of the local stress enhancement factor, and a "corrected" breakdown value is calculated. The original authors conservative treatment of the questionable breakdown value as a "suspension" is supported by analysis with inclusion of a stress-corrected breakdown value, and the two approaches yield similar failure distributions. Use of the uncorrected value in discussions related to failure probabilities on the low-stress side of the distribution is shown to substantially underestimate failure stresses
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信