{"title":"采用65nm CMOS的500MS/s 5b ADC","authors":"B. Ginsburg, A. Chandrakasan","doi":"10.1109/VLSIC.2006.1705349","DOIUrl":null,"url":null,"abstract":"A 1.2V 6mW 500MS/s 5-bit ADC for use in a UWB receiver has been fabricated in a pure digital 65nm CMOS technology. The ADC uses a 6-channel time-interleaved successive approximation register architecture. Each of the channels has a split capacitor array to reduce switching energy and sensitivity to digital timing skew. A variable delay line is used to optimize the instant of latch strobing to reduce preamplifier currents","PeriodicalId":366835,"journal":{"name":"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"A 500MS/s 5b ADC in 65nm CMOS\",\"authors\":\"B. Ginsburg, A. Chandrakasan\",\"doi\":\"10.1109/VLSIC.2006.1705349\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 1.2V 6mW 500MS/s 5-bit ADC for use in a UWB receiver has been fabricated in a pure digital 65nm CMOS technology. The ADC uses a 6-channel time-interleaved successive approximation register architecture. Each of the channels has a split capacitor array to reduce switching energy and sensitivity to digital timing skew. A variable delay line is used to optimize the instant of latch strobing to reduce preamplifier currents\",\"PeriodicalId\":366835,\"journal\":{\"name\":\"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2006.1705349\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2006.1705349","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 1.2V 6mW 500MS/s 5-bit ADC for use in a UWB receiver has been fabricated in a pure digital 65nm CMOS technology. The ADC uses a 6-channel time-interleaved successive approximation register architecture. Each of the channels has a split capacitor array to reduce switching energy and sensitivity to digital timing skew. A variable delay line is used to optimize the instant of latch strobing to reduce preamplifier currents