基于三元逻辑的单向量可测试二进制系统的设计

Proceedings of 26th IEEE International Symposium on Multiple-Valued Logic (ISMVL'96) Pub Date : 1996-01-19 DOI:10.1109/ISMVL.1996.508337

Mou Hu

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引用次数: 0

摘要

定义了一个新的概念——单向量可测性。提出了一种基于三元逻辑实现二元系统单向量可测性的设计方法。利用所提出的设计方法，对基于三元电路的可测试二进制系统的设计技术进行了重新研究。

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Design of one-vector testable binary systems based on ternary logic

A new concept, one-vector testability, is defined. Design method to achieve one-vector testability of binary systems based on ternary logic is proposed. Some techniques for designing testable binary systems based on ternary circuits are re-examined by using the proposed design method.

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Proceedings of 26th IEEE International Symposium on Multiple-Valued Logic (ISMVL'96)

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