{"title":"FPGA上RO PUF系统变化的新型RPM技术","authors":"M. Mustapa, M. Niamat","doi":"10.1109/NAECON.2014.7045838","DOIUrl":null,"url":null,"abstract":"Physical Unclonable Function (PUF) is a function that cannot be modeled as it utilizes the random process variations on a silicon chip to generate a unique bit stream of `1's and `0's (response bits) which can be used for authentication and cryptography applications. As PUF is highly rely upon process variations, the response bits generated are governed by the systematic process variation instead of the stochastic process variation, which will reduce the randomness in the response bits. In this paper we propose the novel Random Patch Mixer (RPM) technique to dismiss the systematic variation effect on the response bits generated. We applied the RPM technique on data obtained from 29 Spartan 3E FPGA chips. We showed that our RPM technique has successfully dismissed the systematic variation effect on the response bits generated from the ROPUF on FPGA. We also proved that the responses generated by applying the RPM Technique passed the National Institute of Standards and Technology NIST statistical test for randomness.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Novel RPM technique to dismiss systematic variation for RO PUF on FPGA\",\"authors\":\"M. Mustapa, M. Niamat\",\"doi\":\"10.1109/NAECON.2014.7045838\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Physical Unclonable Function (PUF) is a function that cannot be modeled as it utilizes the random process variations on a silicon chip to generate a unique bit stream of `1's and `0's (response bits) which can be used for authentication and cryptography applications. As PUF is highly rely upon process variations, the response bits generated are governed by the systematic process variation instead of the stochastic process variation, which will reduce the randomness in the response bits. In this paper we propose the novel Random Patch Mixer (RPM) technique to dismiss the systematic variation effect on the response bits generated. We applied the RPM technique on data obtained from 29 Spartan 3E FPGA chips. We showed that our RPM technique has successfully dismissed the systematic variation effect on the response bits generated from the ROPUF on FPGA. We also proved that the responses generated by applying the RPM Technique passed the National Institute of Standards and Technology NIST statistical test for randomness.\",\"PeriodicalId\":318539,\"journal\":{\"name\":\"NAECON 2014 - IEEE National Aerospace and Electronics Conference\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NAECON 2014 - IEEE National Aerospace and Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAECON.2014.7045838\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.2014.7045838","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
摘要
物理不可克隆函数(PUF)是一种无法建模的函数,因为它利用硅芯片上的随机过程变化来生成唯一的“1”和“0”(响应位)比特流,可用于身份验证和加密应用程序。由于PUF高度依赖过程变化,因此产生的响应位由系统过程变化而不是随机过程变化控制,从而降低了响应位的随机性。在本文中,我们提出了一种新的随机补片混频器(RPM)技术来消除系统变化对产生的响应位的影响。我们将RPM技术应用于从29个Spartan 3E FPGA芯片获得的数据。我们表明,我们的RPM技术已经成功地消除了FPGA上ROPUF产生的响应位的系统变化效应。我们还证明了应用RPM技术产生的响应通过了美国国家标准与技术研究所NIST的随机性统计检验。
Novel RPM technique to dismiss systematic variation for RO PUF on FPGA
Physical Unclonable Function (PUF) is a function that cannot be modeled as it utilizes the random process variations on a silicon chip to generate a unique bit stream of `1's and `0's (response bits) which can be used for authentication and cryptography applications. As PUF is highly rely upon process variations, the response bits generated are governed by the systematic process variation instead of the stochastic process variation, which will reduce the randomness in the response bits. In this paper we propose the novel Random Patch Mixer (RPM) technique to dismiss the systematic variation effect on the response bits generated. We applied the RPM technique on data obtained from 29 Spartan 3E FPGA chips. We showed that our RPM technique has successfully dismissed the systematic variation effect on the response bits generated from the ROPUF on FPGA. We also proved that the responses generated by applying the RPM Technique passed the National Institute of Standards and Technology NIST statistical test for randomness.