MEMS惯性传感器中的芯片磨损:通过测试结构对稳定性的影响和预测分析

L. G. Pagani, L. Guerinoni, L. Falorni, G. Gattere, Giovanni Mogavero, A. Ghisi, G. Langfelder
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引用次数: 3

摘要

电容式MEMS惯性传感器中固定和运动部件之间的碰撞会产生碎片和磨损,从而破坏设备的稳定性。这项工作通过专门的测试结构研究了转子和挡板之间的冲击和摩擦的影响。在对场景进行建模后,考虑了冲击动能和硅材料的抗拉/抗压标称强度,研究了不同的塞子拓扑结构和碰撞角度。结果显示,冲击动能高达40 nJ(典型惯性传感器质量在1-3 m/s范围内的速度)与硅破裂之间的关系,并为鲁棒传感器设计提供了第一个指导方针。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Chipping and wearing in MEMS inertial sensors: effects on stability and predictive analysis through test structures
Impacts between fixed and moving parts in capacitive MEMS inertial sensors can generate debris and wear that undermine the device stability. This work investigates the effects of impacts and friction between rotors and stoppers through dedicated test structures. After modeling the scenario, considering the impact kinetic energy and the tensile/ compressive nominal strength of silicon, different stopper topologies and collision angles are studied. Results show how impact kinetic energies, up to 40 nJ (velocities in the 1-3 m/s range for typical inertial sensor masses), correlate with silicon rupture and provide first guidelines for robust sensors design.
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