长沟道mosfet的gm-I依赖性实验研究与建模

M. Cheng, V. Prodanov
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引用次数: 1

摘要

本文描述了ALD1106和ALD1107阵列电流跨导依赖性的实验研究和建模。该研究验证了这7.8 $\mu$m的mosfet的I-gm依赖性符合先进紧凑模型(ACM)的假设。然而,执行的测量结果并不支持这种期望。尽管长度相对较大,但ALD1106和ALD1107都表现出足够明显的“短通道”效应,使得ACM不足。作为这项工作的副产品,我们确认了修改后的ACM方程。由于m因子约为0.6,它很好地捕获了I-gm依赖性。本文还介绍了I-gm模型提取和调优的几种公式和步骤。这些不是特定于ALD晶体管家族,可以应用于具有不同物理尺寸和电气性能的mosfet。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental Study and Modeling of the gm-I Dependence of Long-Channel MOSFETs
this paper describes an experimental study and modeling of the current-transconductance dependence of the ALD1106 and ALD1107 arrays. The study tests the hypothesis that the I-gm dependence of these 7.8 $\mu$m MOSFETs conforms to the Advanced Compact Model (ACM). Results from performed measurements, however, do not support this expectation. Despite the relatively large length, both ALD1106 and ALD1107 show sufficiently pronounced ‘short-channel’ effects to render the ACM inadequate. As a byproduct of this effort, we confirmed the modified ACM equation. With an m factor of approximately 0.6, it captures the I-gm dependence quite well. The paper also introduces several formulas and procedures for I-gm model extraction and tuning. These are not specific to the ALD transistor family and can be applied to MOSFETs with different physical size and electrical performance.
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