{"title":"基于(Bi,Sb)/sub 2/Te/sub 3/的n型热电材料的改进,温度低于200 K","authors":"V. Kutasov, L. N. Lukyanova, P. Konstantinov","doi":"10.1109/ICT.1999.843397","DOIUrl":null,"url":null,"abstract":"An application of Bi/sub 2-x/Sb/sub x/Te/sub 3/ solid solution for low temperature range (80 K<T<200 K) is considered. It is shown that weak temperature dependence of Seebeck coefficient /spl alpha/, decrease in thermal conductivity of the lattice /spl kappa//sub L/ and increase in charge carrier mobility /spl mu//sub 0/ are observed in optimized samples at T<200 K in comparison with a traditional solid solution n-Bi/sub 2/Te/sub 3-y/Se/sub y/. These factors result in growth of parameter /spl beta//spl sim/ZT.","PeriodicalId":253439,"journal":{"name":"Eighteenth International Conference on Thermoelectrics. Proceedings, ICT'99 (Cat. No.99TH8407)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improved thermoelectric material of n-type based on (Bi,Sb)/sub 2/Te/sub 3/ for temperatures below 200 K\",\"authors\":\"V. Kutasov, L. N. Lukyanova, P. Konstantinov\",\"doi\":\"10.1109/ICT.1999.843397\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An application of Bi/sub 2-x/Sb/sub x/Te/sub 3/ solid solution for low temperature range (80 K<T<200 K) is considered. It is shown that weak temperature dependence of Seebeck coefficient /spl alpha/, decrease in thermal conductivity of the lattice /spl kappa//sub L/ and increase in charge carrier mobility /spl mu//sub 0/ are observed in optimized samples at T<200 K in comparison with a traditional solid solution n-Bi/sub 2/Te/sub 3-y/Se/sub y/. These factors result in growth of parameter /spl beta//spl sim/ZT.\",\"PeriodicalId\":253439,\"journal\":{\"name\":\"Eighteenth International Conference on Thermoelectrics. Proceedings, ICT'99 (Cat. No.99TH8407)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Eighteenth International Conference on Thermoelectrics. Proceedings, ICT'99 (Cat. No.99TH8407)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICT.1999.843397\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Eighteenth International Conference on Thermoelectrics. Proceedings, ICT'99 (Cat. No.99TH8407)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICT.1999.843397","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}