采用铁氧体边缘模式的光控隔离器

T. Kodera
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引用次数: 1

摘要

本文介绍了一种新型的微波隔离器。隔离器的非互易性可以由光学控制。该操作基于两种现象:铁氧体边缘模式和硅衬底上的光产生等离子体。传统的铁氧体边模隔离器是由铁氧体和电阻材料制成的。后者用于吸收隔离器的反向传播波。电阻体选择不当导致吸收不完全;隔离比减小。本文利用这种隔离的变化,引入了一种新的隔离器。光学控制是通过改变光照强度来产生硅衬底上等离子体密度的变化来实现的。对隔振器的频率响应进行了实验和数值研究。采用时域有限差分法进行了数值分析。数值和实验结果表明,在硅衬底上进行激光照射,可将隔离比控制在11GHz下39db。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An optically controlled isolator using ferrite edge mode
This paper introduces a new type of microwave isolator. The nonreciprocity of the isolator can be optically controlled. The operation is based on the two phenomena: the ferrite edge-mode and the photo-generated plasma on silicon substrate. Conventional ferrite edge-mode isolator has been made of the ferrite and the resistive material. The later is used to absorb the reverse-propagating wave of the isolator. An inadequate choice of the resistive body leads to the imperfect absorption; the isolation ratio decreases. In this paper, a novel isolator is introduced by using this change of isolation. The optical control is realized by changing the intensity of illumination to produce the variation of the plasma density on the silicon substrate. On the isolator, the frequency response is investigated both experimentally and numerically. The numerical analysis is performed by the FDTD method. Both numerical and experimental results have shown that the isolation ratio can be controlled for 39 dB at 11GHz by the laser-illumination on the silicon substrate.
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