0.1 /spl mu/m以下CMOS小型化的问题及解决方案

H. Iwai, S. Ohmi
{"title":"0.1 /spl mu/m以下CMOS小型化的问题及解决方案","authors":"H. Iwai, S. Ohmi","doi":"10.1109/SMELEC.2000.932298","DOIUrl":null,"url":null,"abstract":"Progress of MOS LSI has been achieved by continuous downsizing of its components. However, the downsizing of CMOS devices is now facing severe difficulties at the 0.1 /spl mu/m generation because of various expected limitations. In order to overcome the problems, introduction of new materials and device structures are investigated. This paper explains the difficulties of downsizing CMOS devices below 0.1 /spl mu/m, and then, future CMOS technologies for new materials, processes and structures which are expected to solve the problems.","PeriodicalId":359114,"journal":{"name":"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Problems and solutions for downsizing CMOS below 0.1 /spl mu/m\",\"authors\":\"H. Iwai, S. Ohmi\",\"doi\":\"10.1109/SMELEC.2000.932298\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Progress of MOS LSI has been achieved by continuous downsizing of its components. However, the downsizing of CMOS devices is now facing severe difficulties at the 0.1 /spl mu/m generation because of various expected limitations. In order to overcome the problems, introduction of new materials and device structures are investigated. This paper explains the difficulties of downsizing CMOS devices below 0.1 /spl mu/m, and then, future CMOS technologies for new materials, processes and structures which are expected to solve the problems.\",\"PeriodicalId\":359114,\"journal\":{\"name\":\"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMELEC.2000.932298\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMELEC.2000.932298","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

MOS大规模集成电路的进步是通过其元件的不断小型化来实现的。然而,由于各种预期的限制,CMOS器件的小型化目前在0.1 /spl mu/m一代面临着严峻的困难。为了克服这些问题,研究了新材料和新器件结构的引入。本文阐述了将CMOS器件缩小到0.1 /spl mu/m以下的困难,然后展望了未来的CMOS新材料、新工艺和新结构技术有望解决这些问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Problems and solutions for downsizing CMOS below 0.1 /spl mu/m
Progress of MOS LSI has been achieved by continuous downsizing of its components. However, the downsizing of CMOS devices is now facing severe difficulties at the 0.1 /spl mu/m generation because of various expected limitations. In order to overcome the problems, introduction of new materials and device structures are investigated. This paper explains the difficulties of downsizing CMOS devices below 0.1 /spl mu/m, and then, future CMOS technologies for new materials, processes and structures which are expected to solve the problems.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信