{"title":"包含可编程增益时间差放大器的可重构时间间隔测量电路","authors":"A. Alahmadi, G. Russell, A. Yakovlev","doi":"10.1109/DDECS.2012.6219089","DOIUrl":null,"url":null,"abstract":"Time interval measurement (TIM) is used in a wide range of applications, for example, physics experiments, dynamic testing of integrated circuits (IC), telecommunications, laser distance measurement, X-ray and UV imagers etc., requiring a range of measurement accuracy and resolution. In this work, a reconfigurable TIM is designed with an adjustable resolution range of 15 down to 0.5 ps and a measurement dynamic range of 480 to 16 ps to perform a variety of time related measurements which require different test specifications; such as set-up and hold time and jitter measurements. It is considered that a reconfigurable measurement system will occupy less chip area than a range of measurement circuits designed for one specific test. The reconfigurable TIM consists of two parts, a programmable time difference amplifier and 32 cells tapped delay line. The proposed programmable time difference amplifier is designed to have a variable gain ranging from 4 to 117 with a very wide dynamic input range.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier\",\"authors\":\"A. Alahmadi, G. Russell, A. Yakovlev\",\"doi\":\"10.1109/DDECS.2012.6219089\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Time interval measurement (TIM) is used in a wide range of applications, for example, physics experiments, dynamic testing of integrated circuits (IC), telecommunications, laser distance measurement, X-ray and UV imagers etc., requiring a range of measurement accuracy and resolution. In this work, a reconfigurable TIM is designed with an adjustable resolution range of 15 down to 0.5 ps and a measurement dynamic range of 480 to 16 ps to perform a variety of time related measurements which require different test specifications; such as set-up and hold time and jitter measurements. It is considered that a reconfigurable measurement system will occupy less chip area than a range of measurement circuits designed for one specific test. The reconfigurable TIM consists of two parts, a programmable time difference amplifier and 32 cells tapped delay line. The proposed programmable time difference amplifier is designed to have a variable gain ranging from 4 to 117 with a very wide dynamic input range.\",\"PeriodicalId\":131623,\"journal\":{\"name\":\"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2012.6219089\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2012.6219089","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier
Time interval measurement (TIM) is used in a wide range of applications, for example, physics experiments, dynamic testing of integrated circuits (IC), telecommunications, laser distance measurement, X-ray and UV imagers etc., requiring a range of measurement accuracy and resolution. In this work, a reconfigurable TIM is designed with an adjustable resolution range of 15 down to 0.5 ps and a measurement dynamic range of 480 to 16 ps to perform a variety of time related measurements which require different test specifications; such as set-up and hold time and jitter measurements. It is considered that a reconfigurable measurement system will occupy less chip area than a range of measurement circuits designed for one specific test. The reconfigurable TIM consists of two parts, a programmable time difference amplifier and 32 cells tapped delay line. The proposed programmable time difference amplifier is designed to have a variable gain ranging from 4 to 117 with a very wide dynamic input range.