质子加速器直接电离单事件扰动试验程序

2019 IEEE 31st International Conference on Microelectronics (MIEL) Pub Date : 2019-09-01 DOI:10.1109/MIEL.2019.8889634

A. Akhmetov, G. Sorokoumov, A. Smolin, D. Bobrovsky, D. Boychenko, A. Nikiforov, A. Shemyakov

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引用次数: 2

摘要

本文介绍了在Spartan-6 FPGA上直接和间接质子电离引起的单事件扰动(SEU)实验结果。利用高能质子束和铝箔将质子能量降低到1 ~ 20 MeV，观察质子直接电离扰动。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proton Accelerator's Direct Ionization Single Event Upset Test Procedure

The paper presents single event upset (SEU) experimental results in Spartan-6 FPGA due to direct and indirect proton ionization. High energy proton beam and aluminum foils were used to decrease proton energy down to 1… 20 MeV to observe proton direct ionization upsets.

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来源期刊

2019 IEEE 31st International Conference on Microelectronics (MIEL)

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