{"title":"缓冲层位置对光的影响","authors":"Y. S. Chang, L. Kao, J. Gong","doi":"10.1109/ICICE.2017.8479163","DOIUrl":null,"url":null,"abstract":"The N-buffer layer location of an N-LIGBT was adjusted, and the device characteristics were analyzed. The parameters of the device equivalent circuit were extracted to find the reason of the device improvement. Different parameter extraction methods were compared, it was found that the equipotential line method is the most accurate one.","PeriodicalId":233396,"journal":{"name":"2017 International Conference on Information, Communication and Engineering (ICICE)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Effect of Buffer Layer Location on LIGBT\",\"authors\":\"Y. S. Chang, L. Kao, J. Gong\",\"doi\":\"10.1109/ICICE.2017.8479163\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The N-buffer layer location of an N-LIGBT was adjusted, and the device characteristics were analyzed. The parameters of the device equivalent circuit were extracted to find the reason of the device improvement. Different parameter extraction methods were compared, it was found that the equipotential line method is the most accurate one.\",\"PeriodicalId\":233396,\"journal\":{\"name\":\"2017 International Conference on Information, Communication and Engineering (ICICE)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 International Conference on Information, Communication and Engineering (ICICE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICE.2017.8479163\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Information, Communication and Engineering (ICICE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICE.2017.8479163","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The N-buffer layer location of an N-LIGBT was adjusted, and the device characteristics were analyzed. The parameters of the device equivalent circuit were extracted to find the reason of the device improvement. Different parameter extraction methods were compared, it was found that the equipotential line method is the most accurate one.