基于DRAM的系统级安全内在物理不可克隆功能

Fatemeh Tehranipoor, Nima Karimian, K. Xiao, J. Chandy
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引用次数: 81

摘要

物理不可克隆函数(PUF)是制造过程中随机不可控变量的结果。PUF可以用作随机但可靠的数据源,用于生成芯片标识和加密密钥等应用程序。在各种类型的PUF中,固有PUF是预先存在的制造过程的结果,不需要任何额外的电路,并且具有成本效益。本文介绍了一种基于动态随机存取存储器(DRAM)的内禀PUF。DRAM puf可以用于低成本的识别应用,并且与其他puf相比,它还有几个优点,比如大输入模式。DRAM PUF依赖于这样一个事实,即DRAM中的电容在启动时初始化为随机值。我们展示了真实的DRAM puf,并描述了一个实验装置,以测试三个DRAM的不同工作条件,以获得最高的可靠结果。最后,我们使用注册算法选择最稳定的位作为芯片ID。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DRAM based Intrinsic Physical Unclonable Functions for System Level Security
Physical Unclonable Functions (PUF) are the result of random uncontrollable variables in the manufacturing process. A PUF can be used as a source of random but reliable data for applications such as generating chip identification and encryption keys. Among various types of PUFs, an intrinsic PUF is the result of a preexisting manufacturing process, does not require any additional circuitry, and is cost effective. In this paper, we introduce an intrinsic PUF based on dynamic random access memories (DRAM). DRAM PUFs can be used in low cost identification applications and also have several advantages over other PUFs such as large input patterns. The DRAM PUF relies on the fact that the capacitor in the DRAM initializes to random values at startup. We demonstrate real DRAM PUFs and describe an experimental setup to test different operating conditions on three DRAMs to achieve the highest reliable results. Finally, we select the most stable bits to use as chip ID using our enrollment algorithm.
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