任意应力波形下参数失稳的紧凑模型

2014 44th European Solid State Device Research Conference (ESSDERC) Pub Date : 2014-11-06 DOI:10.1109/ESSDERC.2014.6948812

F. Alagi, M. Rossetti, R. Stella, Emanuele Viganò, P. Raynaud

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引用次数: 6

摘要

提出了一种确定性紧凑的不稳定性模型，该模型能够模拟任意周期应力波形下的可逆参数漂移，适合在商用模拟器(Eldo UDRM)中实现。该方法已应用于nbti诱发的阈值电压漂移;举例说明了恢复仿真在电路设计中起着至关重要的作用。

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Compact model for parametric instability under arbitrary stress waveform

A deterministic compact model of instability is presented, capable of simulating reversible parametric drift under any periodic stress waveform and suitable for the implementation in a commercial simulator (Eldo UDRM). The methodology has been applied to NBTI-induced threshold voltage drift; an example is shown, in which recovery simulation is crucial for circuit design.

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2014 44th European Solid State Device Research Conference (ESSDERC)

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