{"title":"数字电路中电源干扰的建模","authors":"M. Cortes, E. McCluskey, K. Wagner, Dawei Lu","doi":"10.1109/ISSCC.1986.1157008","DOIUrl":null,"url":null,"abstract":"A model that represents errors caused by power supply disturbances as delay faults will be discussed. Experiments reveal that the error susceptibility increases at high clock rates and that metastable states may result.","PeriodicalId":440688,"journal":{"name":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Modeling power-supply disturbances in digital circuit\",\"authors\":\"M. Cortes, E. McCluskey, K. Wagner, Dawei Lu\",\"doi\":\"10.1109/ISSCC.1986.1157008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A model that represents errors caused by power supply disturbances as delay faults will be discussed. Experiments reveal that the error susceptibility increases at high clock rates and that metastable states may result.\",\"PeriodicalId\":440688,\"journal\":{\"name\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1986.1157008\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1986.1157008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling power-supply disturbances in digital circuit
A model that represents errors caused by power supply disturbances as delay faults will be discussed. Experiments reveal that the error susceptibility increases at high clock rates and that metastable states may result.