基于FPGA的同步时序电路故障仿真

P. Ellervee, J. Raik, K. Tammemäe, R. Ubar
{"title":"基于FPGA的同步时序电路故障仿真","authors":"P. Ellervee, J. Raik, K. Tammemäe, R. Ubar","doi":"10.1049/iet-cdt:20050065","DOIUrl":null,"url":null,"abstract":"This paper describes a feasibility study of accelerating fault simulation by emulation on FPGA. Fault simulation b an important subtask in test pattern generation and it is frequently used throughout the test generation process. In order to further speed up simulation, we propose to make use of reconfigurable hardware by emulating circuit together with fault insertion structures on FPGA. Experiments showed that it is beneficial to use emulation for circuits/methods that require large numbers of test vectors, e.g., sequential circuits and/or genetic algorithms.","PeriodicalId":208182,"journal":{"name":"Proceedings Norchip Conference, 2004.","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"FPGA based fault emulation of synchronous sequential circuits\",\"authors\":\"P. Ellervee, J. Raik, K. Tammemäe, R. Ubar\",\"doi\":\"10.1049/iet-cdt:20050065\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a feasibility study of accelerating fault simulation by emulation on FPGA. Fault simulation b an important subtask in test pattern generation and it is frequently used throughout the test generation process. In order to further speed up simulation, we propose to make use of reconfigurable hardware by emulating circuit together with fault insertion structures on FPGA. Experiments showed that it is beneficial to use emulation for circuits/methods that require large numbers of test vectors, e.g., sequential circuits and/or genetic algorithms.\",\"PeriodicalId\":208182,\"journal\":{\"name\":\"Proceedings Norchip Conference, 2004.\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-11-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Norchip Conference, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1049/iet-cdt:20050065\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Norchip Conference, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/iet-cdt:20050065","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

摘要

本文介绍了在FPGA上进行仿真加速故障仿真的可行性研究。故障模拟是测试模式生成的重要子任务,在测试模式生成过程中经常用到。为了进一步加快仿真速度,我们提出利用可重构硬件,在FPGA上模拟电路和故障插入结构。实验表明,对于需要大量测试向量的电路/方法,例如顺序电路和/或遗传算法,使用仿真是有益的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
FPGA based fault emulation of synchronous sequential circuits
This paper describes a feasibility study of accelerating fault simulation by emulation on FPGA. Fault simulation b an important subtask in test pattern generation and it is frequently used throughout the test generation process. In order to further speed up simulation, we propose to make use of reconfigurable hardware by emulating circuit together with fault insertion structures on FPGA. Experiments showed that it is beneficial to use emulation for circuits/methods that require large numbers of test vectors, e.g., sequential circuits and/or genetic algorithms.
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