28nm HKMG GHz数字传感器,用于检测峰值功率优化测试中的动态电压降

M. Igarashi, K. Takeuchi, Y. Takazawa, Y. Igarashi, Hiroaki Matsushita
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引用次数: 0

摘要

我们提出了一种动态电压降传感器,它是完全数字化的,因此很容易设计到产品中并用于测试。2.4 k门GHz传感器利用由不同类型的标准电池组成的两条路径之间的电压灵敏度差异。我们制作了一个28纳米HKMG工艺的测试芯片,并证实了其可行性。该传感器可用于评估扫描测试中的最佳活动率和峰值功率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization
We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.
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