M. Igarashi, K. Takeuchi, Y. Takazawa, Y. Igarashi, Hiroaki Matsushita
{"title":"28nm HKMG GHz数字传感器,用于检测峰值功率优化测试中的动态电压降","authors":"M. Igarashi, K. Takeuchi, Y. Takazawa, Y. Igarashi, Hiroaki Matsushita","doi":"10.1109/CICC.2012.6330710","DOIUrl":null,"url":null,"abstract":"We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.","PeriodicalId":130434,"journal":{"name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization\",\"authors\":\"M. Igarashi, K. Takeuchi, Y. Takazawa, Y. Igarashi, Hiroaki Matsushita\",\"doi\":\"10.1109/CICC.2012.6330710\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.\",\"PeriodicalId\":130434,\"journal\":{\"name\":\"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2012.6330710\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2012.6330710","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization
We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.