使用产品质量估计的确定性测试集的优化

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) Pub Date : 1993-11-16 DOI:10.1109/ATS.1993.398790

G. Spiegel, A. P. Stroele

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引用次数: 6

摘要

在超大规模集成电路中，故障的概率通常相差一个数量级。本文提出了一种考虑这些不同故障概率的产品质量估计方法。描述了两种有效的算法，优化确定性测试集，从而在短测试长度下获得高产品质量。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Optimization of deterministic test sets using an estimation of product quality

The probabilities of faults in VLSI circuits generally differ by order of magnitude. This paper presents an approach to product quality estimation that considers these different fault probabilities. Two efficient algorithms are described that optimize deterministic test sets such that a high product quality is achieved with short test lengths.<>

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Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)

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