基于原子第一性原理的AlxGa1−xAs/GaAs异质结带偏移

Yin Wang, F. Zahid, Y. Zhu, Lei Liu, Jian Wang, Hong Guo
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引用次数: 2

摘要

III-V型化合物半导体及其异质结的性质由于其在电子和光电子技术中的广泛应用而得到了不断的研究。异质结最重要的电子特性之一是能带偏移量,它描述了电子能带在异质结界面上的相对排列。准确确定带偏对于理解异质结的量子输运特性至关重要。对于许多III-V材料体系,波段偏移已经在实验中被仔细测量过
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Band offsets of AlxGa1−xAs/GaAs heterojunction from atomistic first principles
The properties of III-V compound semiconductors and their heterojunctions have been relentlessly investigated due to their wide-ranging applications in electronic and optoelectronic technologies. One of most important electronic property of heterojunctions is the band offset which describes the relative alignment of the electronic bands across the junction interface. Accurate determination of band offsets is critical for understanding quantum transport properties of the heterojuncton. For many III-V materials systems, the band offset has been carefully measured experimentally.[1]
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