{"title":"ram中的冗余","authors":"T. Rodgers","doi":"10.1109/ISSCC.1982.1156306","DOIUrl":null,"url":null,"abstract":"Virtually everyone agrees that the 200%-2000% yield improvement offered by redundancy makes its acceptance a necessity for the economic viability of RAM manufacturers. But, there is considerable controversy over important short-term issues: Should the 64K DRAM have redundancy? Should fuses be programmed by electrical or laser pulses? Will redundancy have an adverse effect on testability and/or reliability? . . . These and related issues will be assessed by the panelists.","PeriodicalId":291836,"journal":{"name":"1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Redundancy in RAMs\",\"authors\":\"T. Rodgers\",\"doi\":\"10.1109/ISSCC.1982.1156306\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Virtually everyone agrees that the 200%-2000% yield improvement offered by redundancy makes its acceptance a necessity for the economic viability of RAM manufacturers. But, there is considerable controversy over important short-term issues: Should the 64K DRAM have redundancy? Should fuses be programmed by electrical or laser pulses? Will redundancy have an adverse effect on testability and/or reliability? . . . These and related issues will be assessed by the panelists.\",\"PeriodicalId\":291836,\"journal\":{\"name\":\"1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1982.1156306\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1982.1156306","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Virtually everyone agrees that the 200%-2000% yield improvement offered by redundancy makes its acceptance a necessity for the economic viability of RAM manufacturers. But, there is considerable controversy over important short-term issues: Should the 64K DRAM have redundancy? Should fuses be programmed by electrical or laser pulses? Will redundancy have an adverse effect on testability and/or reliability? . . . These and related issues will be assessed by the panelists.