SU-8聚合物作为CPW衬底老化的微波宽带表征

A. Lucibello, G. Sardi, E. Proietti, R. Marcelli, G. Bartolucci
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引用次数: 2

摘要

本文介绍了SU-8聚合物作为共面波导(CPW)结构的基层时老化分析的方法和数值结果。作为测试装置,我们使用了一组不同长度的传输线和t型开桩并联谐振器;通过使用这些几何形状,我们能够在1 GHz到40 GHz的宽带范围内获取数据。我们通过比较两种不同的技术运行来进行分析:第一个晶圆使用12年的SU-8沉积层,第二个晶圆使用相同的光刻金属几何形状,使用全新加工的SU-8光刻胶。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microwave broadband characterization of aging of SU-8 polymer as CPW substrate
In this paper we present the methodology and the numerical results related to the analysis of aging of the SU-8 polymer when used as a primary layer for the realization of Coplanar Waveguide (CPW) structures. As test devices, we used a set of transmission lines with different lengths and T-shaped open stubs shunt resonators; by using these geometries, we are able to acquire the data in a broadband range, in principle between 1 GHz and 40 GHz. We conduct the analysis by comparing two different technology run: the first wafer with a deposited layer by a 12-year-old SU-8 and the second wafer, with the same photolithographed metallic geometries, with a brand-new processed SU-8 photoresist.
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