Peyman Nazari, Hossein Mohammadnezhad, E. Preisler, P. Heydari
{"title":"硅impat二极管的宽带非线性集总模型","authors":"Peyman Nazari, Hossein Mohammadnezhad, E. Preisler, P. Heydari","doi":"10.1109/BCTM.2015.7340580","DOIUrl":null,"url":null,"abstract":"A new circuit model based on time-domain characterization of Impact Ionization Avalanche Transit-Time (IMPATT) devices is proposed. The model introduces a new 3rd order low-pass filter to accurately model the delay response of carrier drift inside the drift region, thereby capturing the dispersion caused by carrier diffusion. Moreover, non-stationary effects inside avalanche region as well as the impact of avalanche length modulation on the displacement current are modeled through nonlinear avalanche capacitance.","PeriodicalId":126143,"journal":{"name":"2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM","volume":"65 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A broadband nonlinear lumped model for silicon IMPATT diodes\",\"authors\":\"Peyman Nazari, Hossein Mohammadnezhad, E. Preisler, P. Heydari\",\"doi\":\"10.1109/BCTM.2015.7340580\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new circuit model based on time-domain characterization of Impact Ionization Avalanche Transit-Time (IMPATT) devices is proposed. The model introduces a new 3rd order low-pass filter to accurately model the delay response of carrier drift inside the drift region, thereby capturing the dispersion caused by carrier diffusion. Moreover, non-stationary effects inside avalanche region as well as the impact of avalanche length modulation on the displacement current are modeled through nonlinear avalanche capacitance.\",\"PeriodicalId\":126143,\"journal\":{\"name\":\"2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM\",\"volume\":\"65 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BCTM.2015.7340580\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCTM.2015.7340580","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A broadband nonlinear lumped model for silicon IMPATT diodes
A new circuit model based on time-domain characterization of Impact Ionization Avalanche Transit-Time (IMPATT) devices is proposed. The model introduces a new 3rd order low-pass filter to accurately model the delay response of carrier drift inside the drift region, thereby capturing the dispersion caused by carrier diffusion. Moreover, non-stationary effects inside avalanche region as well as the impact of avalanche length modulation on the displacement current are modeled through nonlinear avalanche capacitance.