{"title":"制程变化下编码片上总线信令延迟变化分析","authors":"S. Tuuna, J. Isoaho, H. Tenhunen","doi":"10.1109/VLSI.2008.73","DOIUrl":null,"url":null,"abstract":"In this paper, we model on-chip signaling over a bus consisting of encoding, drivers, transmission lines, receivers and decoding. We characterize the signaling circuitry as a function of its load capacitance. The effective load capacitance seen by a driver is derived for the decoupling method and distributed RLC transmission line models. The driver delay and rise time corresponding to the derived effective capacitance are used to derive the far-end voltage of a transmission line bus. The effects of process variation are taken into account in the characterization of the signaling circuitry and in the wire analysis. The overall delay variation of the bus due to device and wire process variation is then calculated. The model is verified by comparing it to HSPICE. We implement regular voltage mode, level- encoded dual-rail and l-of-4 signaling circuitry and apply the derived model to analyze them. The implementation and analysis are done in 45 nm technology.","PeriodicalId":143886,"journal":{"name":"21st International Conference on VLSI Design (VLSID 2008)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2008-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Analysis of Delay Variation in Encoded On-Chip Bus Signaling under Process Variation\",\"authors\":\"S. Tuuna, J. Isoaho, H. Tenhunen\",\"doi\":\"10.1109/VLSI.2008.73\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we model on-chip signaling over a bus consisting of encoding, drivers, transmission lines, receivers and decoding. We characterize the signaling circuitry as a function of its load capacitance. The effective load capacitance seen by a driver is derived for the decoupling method and distributed RLC transmission line models. The driver delay and rise time corresponding to the derived effective capacitance are used to derive the far-end voltage of a transmission line bus. The effects of process variation are taken into account in the characterization of the signaling circuitry and in the wire analysis. The overall delay variation of the bus due to device and wire process variation is then calculated. The model is verified by comparing it to HSPICE. We implement regular voltage mode, level- encoded dual-rail and l-of-4 signaling circuitry and apply the derived model to analyze them. The implementation and analysis are done in 45 nm technology.\",\"PeriodicalId\":143886,\"journal\":{\"name\":\"21st International Conference on VLSI Design (VLSID 2008)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-01-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st International Conference on VLSI Design (VLSID 2008)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSI.2008.73\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st International Conference on VLSI Design (VLSID 2008)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI.2008.73","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of Delay Variation in Encoded On-Chip Bus Signaling under Process Variation
In this paper, we model on-chip signaling over a bus consisting of encoding, drivers, transmission lines, receivers and decoding. We characterize the signaling circuitry as a function of its load capacitance. The effective load capacitance seen by a driver is derived for the decoupling method and distributed RLC transmission line models. The driver delay and rise time corresponding to the derived effective capacitance are used to derive the far-end voltage of a transmission line bus. The effects of process variation are taken into account in the characterization of the signaling circuitry and in the wire analysis. The overall delay variation of the bus due to device and wire process variation is then calculated. The model is verified by comparing it to HSPICE. We implement regular voltage mode, level- encoded dual-rail and l-of-4 signaling circuitry and apply the derived model to analyze them. The implementation and analysis are done in 45 nm technology.