基于CMOS技术的射频收发器接收部分的测试策略

2013 18th IEEE European Test Symposium (ETS) Pub Date : 2013-05-27 DOI:10.1109/ETS.2013.6569387

C. Kelma, S. Darfeuille, A. Neuburger, Andreas Lobnig

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引用次数: 1

摘要

研究了栅极长度为0.14μm的恩智浦内部CMOS技术射频收发器接收路径的射频BIST结构。

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RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology

This paper focuses on the RF BIST architecture of the receive path of an RF transceiver processed in the NXP in house CMOS technology with 0.14μm gate length.

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来源期刊

2013 18th IEEE European Test Symposium (ETS)

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