{"title":"增益制导高功率半导体激光器横向近场和远场分布的仿真","authors":"C. Holly, S. McDougall","doi":"10.1109/NUSOD.2019.8806796","DOIUrl":null,"url":null,"abstract":"The objective of this paper is to present the simulation of the lateral emission characteristics of broad-area diode lasers by the example of two devices which differ in contact width, and demonstrate that the applied model is capable to predict far-field divergence and near-field width over current. The numerical results are compared to experimental data.","PeriodicalId":369769,"journal":{"name":"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Simulation of Lateral Near- and Far-Field Profiles of Gain-Guided High-Power Semiconductor Lasers\",\"authors\":\"C. Holly, S. McDougall\",\"doi\":\"10.1109/NUSOD.2019.8806796\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The objective of this paper is to present the simulation of the lateral emission characteristics of broad-area diode lasers by the example of two devices which differ in contact width, and demonstrate that the applied model is capable to predict far-field divergence and near-field width over current. The numerical results are compared to experimental data.\",\"PeriodicalId\":369769,\"journal\":{\"name\":\"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUSOD.2019.8806796\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2019.8806796","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of Lateral Near- and Far-Field Profiles of Gain-Guided High-Power Semiconductor Lasers
The objective of this paper is to present the simulation of the lateral emission characteristics of broad-area diode lasers by the example of two devices which differ in contact width, and demonstrate that the applied model is capable to predict far-field divergence and near-field width over current. The numerical results are compared to experimental data.