Paul D. Gross, Ravishankar Arunachalam, K. Rajagopal, L. Pileggi
{"title":"延迟计算中最坏情况攻击者对准的确定","authors":"Paul D. Gross, Ravishankar Arunachalam, K. Rajagopal, L. Pileggi","doi":"10.1145/288548.288616","DOIUrl":null,"url":null,"abstract":"Increases in delay due to coupling can have a dramatic impact on IC performance for deep submicron technologies. To achieve maximum performance there is a need for analyzing logic stages with large complex coupled interconnects. In timing analysis, the worst case delay of gates along a critical path must include the effect of noise due to switching of nearby aggressor gates. We propose a new waveform iteration strategy to compute the delay in the presence of coupling and to align aggressor inputs to determine the worst case victim delay. We demonstrate the application of our methodology at both the transistor level and cell level. In addition, we prove that the waveforms generated in our methodology converge under typical timing analysis conditions.","PeriodicalId":224802,"journal":{"name":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"125","resultStr":"{\"title\":\"Determination of worst-case aggressor alignment for delay calculation\",\"authors\":\"Paul D. Gross, Ravishankar Arunachalam, K. Rajagopal, L. Pileggi\",\"doi\":\"10.1145/288548.288616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Increases in delay due to coupling can have a dramatic impact on IC performance for deep submicron technologies. To achieve maximum performance there is a need for analyzing logic stages with large complex coupled interconnects. In timing analysis, the worst case delay of gates along a critical path must include the effect of noise due to switching of nearby aggressor gates. We propose a new waveform iteration strategy to compute the delay in the presence of coupling and to align aggressor inputs to determine the worst case victim delay. We demonstrate the application of our methodology at both the transistor level and cell level. In addition, we prove that the waveforms generated in our methodology converge under typical timing analysis conditions.\",\"PeriodicalId\":224802,\"journal\":{\"name\":\"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"125\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/288548.288616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/288548.288616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of worst-case aggressor alignment for delay calculation
Increases in delay due to coupling can have a dramatic impact on IC performance for deep submicron technologies. To achieve maximum performance there is a need for analyzing logic stages with large complex coupled interconnects. In timing analysis, the worst case delay of gates along a critical path must include the effect of noise due to switching of nearby aggressor gates. We propose a new waveform iteration strategy to compute the delay in the presence of coupling and to align aggressor inputs to determine the worst case victim delay. We demonstrate the application of our methodology at both the transistor level and cell level. In addition, we prove that the waveforms generated in our methodology converge under typical timing analysis conditions.