半绝缘GaAs生长后两步退火的介观均匀化

B. Hoffmann, M. Jurisch, G. Kissinger, A. Kohler, G. Kuhnel, T. Reinhold, W. Siegel, B. Weinert
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引用次数: 1

摘要

s.i e e- gaas电性能的介观均匀化通常是通过对晶体进行热处理来实现的,包括砷析出物的溶解、过量砷的均匀化和通过控制过饱和再沉淀的步骤。由于位错的不均匀分布和相应的细胞结构沿腿生长晶体和跨腿生长晶体,适当的选择时间-温度程序是必要的,以尽量减少介观均匀性的波动。提出了一种改进的两步钢锭退火工艺,以保证细观均匀性的均匀分布。晶圆片在不同的砷压力下退火可以控制整个标准厚度的化学计量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mesoscopic homogenization of semi-insulating GaAs by two-step post growth annealing
Mesoscopic homogenization of the electrical properties of s.i. LEC-GaAs is commonly realized by thermal treatment of the crystals including the steps of dissolution of arsenic precipitates, homogenization of excess As and re-precipitation by creating a controlled supersaturation. Caused by the inhomogeneous distribution of dislocations and the corresponding cellular structure along and across LEG-grown crystals a proper choice of the time-temperature program is necessary to minimize fluctuations of mesoscopic homogeneity. A modified two-step ingot annealing process is demonstrated to ensure the homogeneous distribution of mesoscopic homogeneity. Wafer annealing at different arsenic pressures is shown to control stoichiometry over the whole standard thickness.
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