基于tsv的3D-IC放置时间优化

Yi-Rong Chen, Hung-Ming Chen, Shih-Ying Liu
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引用次数: 1

摘要

半导体技术在3D-IC电路中不断进步。3D-IC的概念在最新的设计中引入了额外的维度,通过使用硅通孔(TSV)的堆栈结构。3D集成电路用TSV单元取代2D集成电路中的长互连。但是,针对3DIC的优化在很多方面还不成熟。标准单元和TSV单元的放置在时间优化方面仍然存在问题。在本文中,我们提出了一种同时应用逐层最小切割划分和地址对齐约束的单元格布局方法。我们应用模拟退火来优化时序和缩短长度。在最后阶段,实现了贪婪的合法化过程,以消除细胞与TSV细胞之间的重叠。实验结果表明,与二维集成电路相比,三维集成电路的关键路径的带宽和时延都有很大的提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
TSV-based 3D-IC placement for timing optimization
The semiconductor technology continue its advnacement in 3D-IC circuit. The concept of 3D-IC introduces additional dimension in latest designs by using stack structures with through-silicon via (TSV). 3D ICs replace long interconnect in 2D ICs with TSV cells. However, optimization in terms of 3DIC is still immature in many aspects. There still exist problems in placement of standard cells and TSV cells in terms of timing optimization. In this paper, we proposed a methodology on cell placement by applying min-cut partitioning in one layer after layer assignment and address alignment constraint simultaneously. We applied Simulated Annealing to optimize timing and wirelength reduction. In final stage, a greedy legalization procedure is implemented to remove operlaps between cells and TSV cells. Experimental results show that both the wirelengths and the delay of critical paths in 3DICs are much superior compare to 2D ICs.
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