A. Raghavan, B. Banerjee, S. Venkataraman, J. Laskar
{"title":"直接提取InGaP/GaAs HBT大信号模型","authors":"A. Raghavan, B. Banerjee, S. Venkataraman, J. Laskar","doi":"10.1109/GAAS.2002.1049065","DOIUrl":null,"url":null,"abstract":"A direct extraction method for a compact InGaP/GaAs HBT CAD large signal model including self-heating effects is presented. The current source model including self-heating effect parameters is directly extracted from measured I-V data using a simple procedure. The distributed base resistance and distributed base-collector capacitance are directly extracted from measured S-parameters using a new technique. The extraction procedure for the model is simple, fast, accurate and inherently minimizes the average squared-error between measured and model data thereby requiring no further optimization after extraction.","PeriodicalId":142875,"journal":{"name":"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu","volume":"139 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Direct extraction of InGaP/GaAs HBT large signal model\",\"authors\":\"A. Raghavan, B. Banerjee, S. Venkataraman, J. Laskar\",\"doi\":\"10.1109/GAAS.2002.1049065\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A direct extraction method for a compact InGaP/GaAs HBT CAD large signal model including self-heating effects is presented. The current source model including self-heating effect parameters is directly extracted from measured I-V data using a simple procedure. The distributed base resistance and distributed base-collector capacitance are directly extracted from measured S-parameters using a new technique. The extraction procedure for the model is simple, fast, accurate and inherently minimizes the average squared-error between measured and model data thereby requiring no further optimization after extraction.\",\"PeriodicalId\":142875,\"journal\":{\"name\":\"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu\",\"volume\":\"139 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GAAS.2002.1049065\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.2002.1049065","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct extraction of InGaP/GaAs HBT large signal model
A direct extraction method for a compact InGaP/GaAs HBT CAD large signal model including self-heating effects is presented. The current source model including self-heating effect parameters is directly extracted from measured I-V data using a simple procedure. The distributed base resistance and distributed base-collector capacitance are directly extracted from measured S-parameters using a new technique. The extraction procedure for the model is simple, fast, accurate and inherently minimizes the average squared-error between measured and model data thereby requiring no further optimization after extraction.