M. Marchetti, K. Buisman, M. Pelk, L. Smith, L. D. de Vreede
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A low-cost pulsed RF & I-V measurement setup for isothermal device characterization
A low-cost, highly versatile, pulsed RF — pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.
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