{"title":"一种新型沟槽双极结二极管(TBJD)","authors":"B. You, A. Huang, J. Sin","doi":"10.1109/ISPSD.1999.764080","DOIUrl":null,"url":null,"abstract":"In this paper, a new power diode structure called the trench bipolar junction diode (TBJD) is proposed. For the first time, the feasibility of controlling the anode injection efficiency of a diode by the action of an integrated reverse active transistor is demonstrated. The base of the reverse active transistor is shielded by a deep p/sup +/ trench region in the TBJD to achieve superior dynamic characteristics compared to the conventional p-i-n diode structure. Both simulation and experimental results are provided to illustrate this novel structure.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A new trench bipolar junction diode (TBJD)\",\"authors\":\"B. You, A. Huang, J. Sin\",\"doi\":\"10.1109/ISPSD.1999.764080\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a new power diode structure called the trench bipolar junction diode (TBJD) is proposed. For the first time, the feasibility of controlling the anode injection efficiency of a diode by the action of an integrated reverse active transistor is demonstrated. The base of the reverse active transistor is shielded by a deep p/sup +/ trench region in the TBJD to achieve superior dynamic characteristics compared to the conventional p-i-n diode structure. Both simulation and experimental results are provided to illustrate this novel structure.\",\"PeriodicalId\":352185,\"journal\":{\"name\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1999.764080\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, a new power diode structure called the trench bipolar junction diode (TBJD) is proposed. For the first time, the feasibility of controlling the anode injection efficiency of a diode by the action of an integrated reverse active transistor is demonstrated. The base of the reverse active transistor is shielded by a deep p/sup +/ trench region in the TBJD to achieve superior dynamic characteristics compared to the conventional p-i-n diode structure. Both simulation and experimental results are provided to illustrate this novel structure.