母线中互连电容对邻域的依赖——模型的实验验证

Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Pub Date : 2006-06-22 DOI:10.1109/MIXDES.2006.1706626

A. Jarosz, A. Pfitzner

{"title":"母线中互连电容对邻域的依赖——模型的实验验证","authors":"A. Jarosz, A. Pfitzner","doi":"10.1109/MIXDES.2006.1706626","DOIUrl":null,"url":null,"abstract":"An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed","PeriodicalId":318768,"journal":{"name":"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Interconnection Capacitances Dependence On Further Neighbourhood In The Bus - Experimental Verification Of The Model\",\"authors\":\"A. Jarosz, A. Pfitzner\",\"doi\":\"10.1109/MIXDES.2006.1706626\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed\",\"PeriodicalId\":318768,\"journal\":{\"name\":\"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIXDES.2006.1706626\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIXDES.2006.1706626","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

在我们以前的工作中提出了一个分析模型，考虑到对互连电容的进一步邻里影响(Jarosz, 2002)。本文给出了这些公式的实验验证方法，并设计了一种针对AMS 0.35 mm工艺的测试芯片。对测量结果和模型的正确性进行了讨论

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Interconnection Capacitances Dependence On Further Neighbourhood In The Bus - Experimental Verification Of The Model

An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.

自引率

0.00%

发文量