5G通信中基于硅的射频可靠性挑战

2020 IEEE International Reliability Physics Symposium (IRPS) Pub Date : 2020-04-01 DOI:10.1109/IRPS45951.2020.9129352

P. Colestock, P. Srinivasan, F. Guarín

{"title":"5G通信中基于硅的射频可靠性挑战","authors":"P. Colestock, P. Srinivasan, F. Guarín","doi":"10.1109/IRPS45951.2020.9129352","DOIUrl":null,"url":null,"abstract":"5G communication standards brings new promise and also new challenges. While the sub 6 GHz 5G market can leverage existing III-V front end PA solutions, the broad commercialization of CMOS based power generation at millimeter wave frequencies for 5G will chart new territory for reliable power generation. This paper hopes to lay the groundwork for charting the path to success for CMOS millimeter wave PA reliability from the lab to the fab to the field.","PeriodicalId":116002,"journal":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Silicon Based RF Reliability Challenges for 5G Communications\",\"authors\":\"P. Colestock, P. Srinivasan, F. Guarín\",\"doi\":\"10.1109/IRPS45951.2020.9129352\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"5G communication standards brings new promise and also new challenges. While the sub 6 GHz 5G market can leverage existing III-V front end PA solutions, the broad commercialization of CMOS based power generation at millimeter wave frequencies for 5G will chart new territory for reliable power generation. This paper hopes to lay the groundwork for charting the path to success for CMOS millimeter wave PA reliability from the lab to the fab to the field.\",\"PeriodicalId\":116002,\"journal\":{\"name\":\"2020 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"66 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS45951.2020.9129352\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS45951.2020.9129352","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 8

摘要

5G通信标准带来了新的希望，也带来了新的挑战。虽然低于6 GHz的5G市场可以利用现有的III-V前端PA解决方案，但5G毫米波频率CMOS发电的广泛商业化将为可靠的发电开辟新的领域。本文希望为CMOS毫米波PA可靠性从实验室到工厂再到现场的成功之路奠定基础。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Silicon Based RF Reliability Challenges for 5G Communications

5G communication standards brings new promise and also new challenges. While the sub 6 GHz 5G market can leverage existing III-V front end PA solutions, the broad commercialization of CMOS based power generation at millimeter wave frequencies for 5G will chart new territory for reliable power generation. This paper hopes to lay the groundwork for charting the path to success for CMOS millimeter wave PA reliability from the lab to the fab to the field.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2020 IEEE International Reliability Physics Symposium (IRPS)

自引率

0.00%

发文量