Sergeh Vartanian, G. Allen, F. Irom, L. Scheick, S. Hart, N. V. Vonno, L. Pearce
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Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators
Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.