热反射成像在大功率二极管激光诊断中的应用

2019 IEEE High Power Diode Lasers and Systems Conference (HPD) Pub Date : 2019-10-01 DOI:10.1109/hpd48113.2019.8938679

K. Pipe, R. Swertfeger, P. Leisher, A. Jha, Chen Li, M. Crowley, D. Fullager, J. Helmrich, P. Thiagarajan, R. Deri, E. Feigenbaum

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引用次数: 2

摘要

热反射成像能够在电子和光电子器件中实现高空间分辨率和高温分辨率的表面温度非接触式映射。近年来，我们将基于电荷耦合器件(CCD)的热反射成像技术应用于高功率二极管激光器的小面加热研究。我们已经研究了面加热的来源，包括发射前的背辐照度以及激光在离耦面处的光学吸收。对于后者，我们将温度测量与热模型相结合来推导面形光吸收，并研究了其随器件老化的演变。

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Applications of thermoreflectance imaging to high-power diode laser diagnostics

Thermoreflectance imaging enables noncontact mapping of surface temperature with high spatial resolution and high temperature resolution in electronic and optoelectronic devices. Recently we have applied charge-coupled device (CCD) based thermoreflectance imaging to study facet heating in high-power diode lasers. Sources of facet heating we have examined include back-irradiance as well as optical absorption of laser light at the outcoupling facet prior to emission. For the latter we have combined temperature measurements with a thermal model to derive facet optical absorption and have studied its evolution as the device ages.

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2019 IEEE High Power Diode Lasers and Systems Conference (HPD)

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