{"title":"半导体整流器件动态参数测量原理与方法","authors":"Zhao Fu, Ge Shuxin, Ling Zemin, W. Jinghua","doi":"10.1109/IEMT.1992.639874","DOIUrl":null,"url":null,"abstract":"Shijiazhuang Res. Inst.of Automation No. 12, East Changan St. Shijiazhuang Hebei, P.R. China Post code: 050031 Phone: 0311-551415 In this paper, we propose the principle and the method of the on-line quality analysisand approval, including the concept of dynamic I[R and the dynamic diode equation, present a number of on-line quality phenomena and their change: regularities revealed first based on this princip1,e and method. It proves its correctness and effectiveness, and at the same time states it necessary to revise and supplement the existed IEC standard concerned.","PeriodicalId":403090,"journal":{"name":"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Principle And Method Of Dynamic Parameters Measurement For Semiconductor Rectification Devices\",\"authors\":\"Zhao Fu, Ge Shuxin, Ling Zemin, W. Jinghua\",\"doi\":\"10.1109/IEMT.1992.639874\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shijiazhuang Res. Inst.of Automation No. 12, East Changan St. Shijiazhuang Hebei, P.R. China Post code: 050031 Phone: 0311-551415 In this paper, we propose the principle and the method of the on-line quality analysisand approval, including the concept of dynamic I[R and the dynamic diode equation, present a number of on-line quality phenomena and their change: regularities revealed first based on this princip1,e and method. It proves its correctness and effectiveness, and at the same time states it necessary to revise and supplement the existed IEC standard concerned.\",\"PeriodicalId\":403090,\"journal\":{\"name\":\"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1992.639874\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1992.639874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Principle And Method Of Dynamic Parameters Measurement For Semiconductor Rectification Devices
Shijiazhuang Res. Inst.of Automation No. 12, East Changan St. Shijiazhuang Hebei, P.R. China Post code: 050031 Phone: 0311-551415 In this paper, we propose the principle and the method of the on-line quality analysisand approval, including the concept of dynamic I[R and the dynamic diode equation, present a number of on-line quality phenomena and their change: regularities revealed first based on this princip1,e and method. It proves its correctness and effectiveness, and at the same time states it necessary to revise and supplement the existed IEC standard concerned.
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