{"title":"集成电路开发和制造的成品率管理","authors":"H. Koyama, M. Inokuchi","doi":"10.1109/ASMC.1998.731555","DOIUrl":null,"url":null,"abstract":"The purpose of this paper is to outline a strategic element of yield management methodologies for the development and fabrication of advanced ULSI circuits. Fundamental ideas with regard to knowledge conversion and a detailed yield management system are described.","PeriodicalId":290016,"journal":{"name":"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Yield management for development and manufacture of integrated circuits\",\"authors\":\"H. Koyama, M. Inokuchi\",\"doi\":\"10.1109/ASMC.1998.731555\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The purpose of this paper is to outline a strategic element of yield management methodologies for the development and fabrication of advanced ULSI circuits. Fundamental ideas with regard to knowledge conversion and a detailed yield management system are described.\",\"PeriodicalId\":290016,\"journal\":{\"name\":\"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1998.731555\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1998.731555","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Yield management for development and manufacture of integrated circuits
The purpose of this paper is to outline a strategic element of yield management methodologies for the development and fabrication of advanced ULSI circuits. Fundamental ideas with regard to knowledge conversion and a detailed yield management system are described.