工业设计中的扫描压缩实现-案例研究

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI:10.1109/ATS.2009.89

D. Hsu, R. Press

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引用次数: 0

摘要

嵌入式扫描测试压缩用于实现高测试质量，并已成为许多设计的标准实践。本文介绍了与嵌入式压缩技术相关的功率和时序经验。在三种无线设计中使用了商用工具来实现EDT压缩技术。案例研究和结果表明了功耗降低方法和定时关闭考虑的效果。

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Scan Compression Implementation in Industrial Design - Case Study

Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs. The case study and results demonstrate the effect of power reduction methods and timing closure considerations.

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2009 Asian Test Symposium

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