{"title":"一种实用的GaN封装器件高频去嵌入网络","authors":"S. Dong, P. Tasker, Guofeng Wang, J. Lees","doi":"10.1109/IEEE-IWS.2016.7585473","DOIUrl":null,"url":null,"abstract":"The intrinsic performance of the devices is of great meaning during power amplifiers design. A method to update de-embedding network at higher frequency for packaged power devices is put forward based on physical modeling idea. The de-embedding network at 5.8 GHz of a packaged GaN HEMT is presented and its practicability is verified through error analysis. This method is prospected to be applied to other packaged microwave devices.","PeriodicalId":185971,"journal":{"name":"2016 IEEE MTT-S International Wireless Symposium (IWS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A practicable de-embedding network at higher frequency of a packaged GaN device\",\"authors\":\"S. Dong, P. Tasker, Guofeng Wang, J. Lees\",\"doi\":\"10.1109/IEEE-IWS.2016.7585473\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The intrinsic performance of the devices is of great meaning during power amplifiers design. A method to update de-embedding network at higher frequency for packaged power devices is put forward based on physical modeling idea. The de-embedding network at 5.8 GHz of a packaged GaN HEMT is presented and its practicability is verified through error analysis. This method is prospected to be applied to other packaged microwave devices.\",\"PeriodicalId\":185971,\"journal\":{\"name\":\"2016 IEEE MTT-S International Wireless Symposium (IWS)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-03-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE MTT-S International Wireless Symposium (IWS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEEE-IWS.2016.7585473\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE MTT-S International Wireless Symposium (IWS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEEE-IWS.2016.7585473","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A practicable de-embedding network at higher frequency of a packaged GaN device
The intrinsic performance of the devices is of great meaning during power amplifiers design. A method to update de-embedding network at higher frequency for packaged power devices is put forward based on physical modeling idea. The de-embedding network at 5.8 GHz of a packaged GaN HEMT is presented and its practicability is verified through error analysis. This method is prospected to be applied to other packaged microwave devices.