{"title":"基于故障安全电路的软错误容错顺序电路设计","authors":"S. Ostanin, A. Matrosova, N. Butorina, V. Lavrov","doi":"10.1109/EWDTS.2016.7807676","DOIUrl":null,"url":null,"abstract":"This paper presents a fault-tolerant synchronous sequential circuit design based on fault-secure system with low overhead. The scheme has only one fault-secure sequential circuit, a normal (unprotected) sequential circuit, a checker and rather simple XOR circuit. It is proved the reliability properties of the suggested scheme not only for single stuck-at faults at gate poles but for path delay faults transient and intermittent. It is supposed that each next fault appears when a previous one has disappeared.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit\",\"authors\":\"S. Ostanin, A. Matrosova, N. Butorina, V. Lavrov\",\"doi\":\"10.1109/EWDTS.2016.7807676\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a fault-tolerant synchronous sequential circuit design based on fault-secure system with low overhead. The scheme has only one fault-secure sequential circuit, a normal (unprotected) sequential circuit, a checker and rather simple XOR circuit. It is proved the reliability properties of the suggested scheme not only for single stuck-at faults at gate poles but for path delay faults transient and intermittent. It is supposed that each next fault appears when a previous one has disappeared.\",\"PeriodicalId\":364686,\"journal\":{\"name\":\"2016 IEEE East-West Design & Test Symposium (EWDTS)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE East-West Design & Test Symposium (EWDTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EWDTS.2016.7807676\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2016.7807676","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit
This paper presents a fault-tolerant synchronous sequential circuit design based on fault-secure system with low overhead. The scheme has only one fault-secure sequential circuit, a normal (unprotected) sequential circuit, a checker and rather simple XOR circuit. It is proved the reliability properties of the suggested scheme not only for single stuck-at faults at gate poles but for path delay faults transient and intermittent. It is supposed that each next fault appears when a previous one has disappeared.