{"title":"硅二极管在强微波场温度测量中的应用","authors":"D. Afonin, Ye.R. Kanunov","doi":"10.1109/CRMICO.2003.158905","DOIUrl":null,"url":null,"abstract":"This paper discusses the application of silicon diode in the research of EM distribution and temperature measurements in strong microwave fields. Advantages of using silicon diodes for these purposes are outlined.","PeriodicalId":131192,"journal":{"name":"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application of silicon diode for temperature measurements in strong microwave fields\",\"authors\":\"D. Afonin, Ye.R. Kanunov\",\"doi\":\"10.1109/CRMICO.2003.158905\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the application of silicon diode in the research of EM distribution and temperature measurements in strong microwave fields. Advantages of using silicon diodes for these purposes are outlined.\",\"PeriodicalId\":131192,\"journal\":{\"name\":\"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2003.158905\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th International Crimean Conference Microwave and Telecommunication Technology, 2003. CriMiCo 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2003.158905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of silicon diode for temperature measurements in strong microwave fields
This paper discusses the application of silicon diode in the research of EM distribution and temperature measurements in strong microwave fields. Advantages of using silicon diodes for these purposes are outlined.