磁性薄膜的软x射线共振散射

Joint NAPMRC 2003. Digest of Technical Papers Pub Date : 2003-01-06 DOI:10.1109/NAPMRC.2003.1177058

E. Fullerton, O. Hellwig, S. Kevan, L. Sorensen, J. Kortright

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引用次数: 0

摘要

我们已经应用共振SAS来表征co基多层以及coptcr基垂直和纵向介质的化学和磁性非均质性。通过将x射线能量调整到Co和Cr边缘，可以实现化学和磁性非均质性的分离。

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Resonant soft x-ray scattering from magnetic thin films

We have applied resonant SAS to characterize the chemical and magnetic heterogeneity of Co-based multilayers as well as CoPtCr-based perpendicular and longitudinal media. Separation of the chemical vs. magnetic heterogeneity is achieved by tuning the x-ray energy to both the Co and Cr edges.

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Joint NAPMRC 2003. Digest of Technical Papers

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