V. Volkov, S. Bozhevolnyi, P. Borel, L. Frandsen, M. Kristensen
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Near-field characterization of photonic crystal components
In this paper, we have employed a collection scanning near-field optical microscope (SNOM) for imaging of the propagation of light at telecommunication wavelengths along straight and bent photonic crystal (PC) waveguides with Y-splitters, Z-bends and simple couplers that were fabricated on silicon-on-insulator (SOl) wafers