{"title":"含自热效应的SOI-MOSFET I-V特性自适应神经网络模型","authors":"M. A. Karami, A. Afzali-Kusha","doi":"10.1109/ICM.2006.373640","DOIUrl":null,"url":null,"abstract":"In this paper, a model for SOI MOSFETs which considers the self-heating effect is proposed. The model which is based on a multi layer perceptron (MLP) neural network, generates the drain current as a function of the gate-source voltage, drain-source voltage, and the device temperature. Based on the current, the temperature of the device channel is calculated. The neural network adapts itself with the channel temperature which can be calculated by an equivalent thermal model for the SOI device.","PeriodicalId":284717,"journal":{"name":"2006 International Conference on Microelectronics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Adaptive Neural Network Model for SOI-MOSFET I-V Characteristic Including Self-Heating Effect\",\"authors\":\"M. A. Karami, A. Afzali-Kusha\",\"doi\":\"10.1109/ICM.2006.373640\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a model for SOI MOSFETs which considers the self-heating effect is proposed. The model which is based on a multi layer perceptron (MLP) neural network, generates the drain current as a function of the gate-source voltage, drain-source voltage, and the device temperature. Based on the current, the temperature of the device channel is calculated. The neural network adapts itself with the channel temperature which can be calculated by an equivalent thermal model for the SOI device.\",\"PeriodicalId\":284717,\"journal\":{\"name\":\"2006 International Conference on Microelectronics\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 International Conference on Microelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2006.373640\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 International Conference on Microelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2006.373640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Adaptive Neural Network Model for SOI-MOSFET I-V Characteristic Including Self-Heating Effect
In this paper, a model for SOI MOSFETs which considers the self-heating effect is proposed. The model which is based on a multi layer perceptron (MLP) neural network, generates the drain current as a function of the gate-source voltage, drain-source voltage, and the device temperature. Based on the current, the temperature of the device channel is calculated. The neural network adapts itself with the channel temperature which can be calculated by an equivalent thermal model for the SOI device.