在1Mb CMOS SRAM上的两种新型断电电路

M. Matsui, S. Hayakawa, K. Sato, A. Suzuki, N. Upakawa, T. Hamano, T. Ohtani, K. Ochit
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引用次数: 3

摘要

由于单元数量和晶体管可驱动性的增加,规模化sram的功耗很大。在CMOS sram中,读操作广泛采用自动断电(APD)方案[I]。在APD方案中,空转电流必不可少的字线和感测放大器由地址转换检测器(atd)产生的定时器脉冲动态激活。降低了较低频率的工作功率。为了挽救最慢的比特,提高产量。但是,APD定时器脉冲的宽度应该是接入时间的1.0 - 1.5倍。因此,在最小运行周期下,APD方案不能起到降功率的作用。此外,该方案对写操作不起作用。本文介绍了两种适用于高密度CMOS sram的新型断电电路。一种是自定时断电(SPD)方案,采用自定时机制完成数据读出。另一种是写操作自动断电方案(APDW)。在1M位CMOS SRAM上验证了这些新电路的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Two novel power-down circuits on the 1Mb CMOS SRAM
Scaled SRAMs suffer from large power dissipation because both the number of cells and the transistor drivability increase. In CMOS SRAMs the automatic power down (APD) scheme ([I]) is widely used on the read operation. In the APD scheme, word lines and sense amplifiers to which idling current is indispensable, are activaled dynamically by a timer pulse which is generated from address transition demtors (ATDs). and the operation power on rather low frequency is reduced. In order to salvage the slowest bits and to improve yield. however, the APD timer pulse should be 1.0 1.5 times as wide as the access time. Therefore the APD scheme cannot conribule the power reduction under the'minimum operation cycle. Besides, the scheme doesn't function on the write operation. This paper describes two novel power down circuits suitable for high density CMOS SRAMs. One is self-timed power down (SPD) scheme which employs self-timed mechanism for the data read-out completion. The other is automatic power down scheme on the write operation (APDW). The effectiveness of these new circuits is demonstrated on a 1M bit CMOS SRAM.
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