{"title":"使用ATE的半定制锁存特性","authors":"S. Gaviraghi","doi":"10.1109/EASIC.1990.207985","DOIUrl":null,"url":null,"abstract":"An ATE approach for latch-up static test is proposed that allows a quick and complete characterization of devices even with a very high pin count. The software tool is described and some results presented.<<ETX>>","PeriodicalId":205695,"journal":{"name":"[Proceedings] EURO ASIC `90","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Latch-up characterization of semicustom using ATE\",\"authors\":\"S. Gaviraghi\",\"doi\":\"10.1109/EASIC.1990.207985\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An ATE approach for latch-up static test is proposed that allows a quick and complete characterization of devices even with a very high pin count. The software tool is described and some results presented.<<ETX>>\",\"PeriodicalId\":205695,\"journal\":{\"name\":\"[Proceedings] EURO ASIC `90\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[Proceedings] EURO ASIC `90\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EASIC.1990.207985\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] EURO ASIC `90","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EASIC.1990.207985","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An ATE approach for latch-up static test is proposed that allows a quick and complete characterization of devices even with a very high pin count. The software tool is described and some results presented.<>
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