50nm栅长CMOS的微观射频噪声仿真及噪声源建模

G. Niu, Yan Cui, S. S. Taylor
{"title":"50nm栅长CMOS的微观射频噪声仿真及噪声源建模","authors":"G. Niu, Yan Cui, S. S. Taylor","doi":"10.1109/SMIC.2004.1398183","DOIUrl":null,"url":null,"abstract":"The RF noise of 50 nm gate length CMOS is simulated using hydrodynamic noise simulation. Intrinsic noise sources for the Y- and H-representations are examined and models of intrinsic noise sources are proposed.","PeriodicalId":288561,"journal":{"name":"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Microscopic RF noise simulation and noise source modeling in 50 nm gate length CMOS\",\"authors\":\"G. Niu, Yan Cui, S. S. Taylor\",\"doi\":\"10.1109/SMIC.2004.1398183\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The RF noise of 50 nm gate length CMOS is simulated using hydrodynamic noise simulation. Intrinsic noise sources for the Y- and H-representations are examined and models of intrinsic noise sources are proposed.\",\"PeriodicalId\":288561,\"journal\":{\"name\":\"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-09-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMIC.2004.1398183\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMIC.2004.1398183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

采用流体动力噪声仿真方法对50 nm栅长CMOS的射频噪声进行了仿真。研究了Y和h表示的本征噪声源,并提出了本征噪声源的模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microscopic RF noise simulation and noise source modeling in 50 nm gate length CMOS
The RF noise of 50 nm gate length CMOS is simulated using hydrodynamic noise simulation. Intrinsic noise sources for the Y- and H-representations are examined and models of intrinsic noise sources are proposed.
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