{"title":"50nm栅长CMOS的微观射频噪声仿真及噪声源建模","authors":"G. Niu, Yan Cui, S. S. Taylor","doi":"10.1109/SMIC.2004.1398183","DOIUrl":null,"url":null,"abstract":"The RF noise of 50 nm gate length CMOS is simulated using hydrodynamic noise simulation. Intrinsic noise sources for the Y- and H-representations are examined and models of intrinsic noise sources are proposed.","PeriodicalId":288561,"journal":{"name":"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Microscopic RF noise simulation and noise source modeling in 50 nm gate length CMOS\",\"authors\":\"G. Niu, Yan Cui, S. S. Taylor\",\"doi\":\"10.1109/SMIC.2004.1398183\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The RF noise of 50 nm gate length CMOS is simulated using hydrodynamic noise simulation. Intrinsic noise sources for the Y- and H-representations are examined and models of intrinsic noise sources are proposed.\",\"PeriodicalId\":288561,\"journal\":{\"name\":\"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-09-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMIC.2004.1398183\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMIC.2004.1398183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microscopic RF noise simulation and noise source modeling in 50 nm gate length CMOS
The RF noise of 50 nm gate length CMOS is simulated using hydrodynamic noise simulation. Intrinsic noise sources for the Y- and H-representations are examined and models of intrinsic noise sources are proposed.